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Predicted septuple-atomic-layer Janus MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers with Rashba spin splitting and high electron carrier mobilities

San-Dong Guo1,2, Wen-Qi Mu1, Yu-Tong Zhu1, Ru-Yue Han1 and Wen-Cai Ren3,4 1School of Electronic Engineering, Xi’an University of Posts and Telecommunications, Xi’an 710121, China 2Key Laboratary of Advanced Semiconductor Devices and Materials, Xi’an University of Posts and Telecommunications, Xi’an 710121, China 3Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Science, 110016 Shenyang, Liaoning, P. R. China 4School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, P. R. China
Abstract

Janus two-dimensional (2D) materials have attracted much attention due to possessing unique properties caused by their out-of-plane asymmetry, which have been achieved in many 2D families. In this work, the Janus monolayers are predicted in new 2D MA2Z4\mathrm{MA_{2}Z_{4}} family by means of first-principles calculations, MoSi2N4\mathrm{MoSi_{2}N_{4}} and WSi2N4\mathrm{WSi_{2}N_{4}} of which have been synthesized in experiment(\textcolor[rgb]0.00,0.00,1.00Science 369, 670-674 (2020)). The predicted MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers exhibit dynamic, thermodynamical and mechanical stability, and they are indirect band-gap semiconductors. The inclusion of spin-orbit coupling (SOC) gives rise to the Rashba-type spin splitting, which is observed in the valence bands, being different from common conduction bands. Calculated results show valley polarization at the edge of the conduction bands due to SOC together with inversion symmetry breaking. It is found that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers have high electron mobilities. Both in-plane and much weak out-of-plane piezoelectric polarizations can be observed, when a uniaxial strain in the basal plane is applied. The values of piezoelectric strain coefficient d11d_{11} of the Janus MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers fall between those of the MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W) and MGe2N4\mathrm{MGe_{2}N_{4}} (M=Mo and W) monolayers, as expected. It is proved that strain can tune the positions of valence band maximum (VBM) and conduction band minimum (CBM), and enhance the the strength of conduction bands convergence caused by compressive strain. It is also found that tensile biaxial strain can enhance d11d_{11} of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, and the compressive strain can improve the d31d_{31} (absolute values). Our predicted MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers as derivatives of 2D MA2Z4\mathrm{MA_{2}Z_{4}} family enrich Janus 2D materials, and can motivate related experimental works.

Janus monolayers, Carrier mobility, Piezoelectronics
pacs:
71.20.-b, 77.65.-j, 72.15.Jf, 78.67.-n                                    Email:sandongyuwang@163.com

I Introduction

The exploration of grapheneq6 enormously promotes the search for new 2D materials both in experiment and in theory, which have potential applications in the field of optoelectronics, spintronics, valleytronics and energy conversion and storage. Numerous 2D materials have been found, including transition metal chalcogenides (TMDs), group-VA, group IV-VI, group-IV, transition metal carbides/nitrides (Mxenes), Cr2Ge2Te6\mathrm{Cr_{2}Ge_{2}Te_{6}}, Mn2C6Se12\mathrm{Mn_{2}C_{6}Se_{12}} and Mn2C6S6Se6\mathrm{Mn_{2}C_{6}S_{6}Se_{6}} monolayersq7 ; q8 ; q9 ; p1 ; q6-1 ; q6-1-1 ; q6-1-2 ; q6-1-3 ; q6-1-4 ; q6-2 ; q10 ; q11 . The unique crystal structure together with strong SOC in monolayer TMDs demonstrates coupled spin-valley physicsq6-5 , and the buckled honeycomb structure plus strong SOC can give rise to quantum spin Hall (QSH) and quantum anomalous Hall (QAH) effects in a particular type of 2D Xeneq6-5-1 ; q6-5-2 . An emerging class of 2D materials (Janus 2D materials) have currently attracted increasing attention due to unique crystal structures, which lack the reflection symmetry with respect to the central atomic layerq6-5-3 . In these 2D Janus materials, the strong Rashba spin splitting, second harmonic generation response and out-of-plane piezoelectric polarizations can be achievedq6-5-3 . Many Janus 2D materials have been proposed, such as Janus graphene, asymmetrically functionalizing silicene monolayer, Janus TMDs, Janus transition-metal oxides, PtSSe, TiXY (X/Y=S, Se and Te), VSSe, SnSSe and Janus group-III monochalcogenide M2XY\mathrm{M_{2}XY} (M=Ga, In; X/Y=S, Se, Te)zs-1 ; zs-2 ; zs-3 ; zs-4 ; zs-5 ; zs-6 ; zs-7 ; zs-8 ; zs-9 . Recently, Janus monolayer MoSSe has been successfully achieved by different experimental strategiesp1 ; p1-new with additional out-of-plane piezoelectric coefficientp2 ; p2-new .

Refer to caption
Figure 1: (Color online) The top view (a) and side view (b) crystal structure of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayer. The rhombus primitive cell and the rectangle supercell are marked by black and green lines.
Refer to caption
Figure 2: (Color online) The phonon band dispersions of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W).

Recently, by chemical vapor deposition (CVD), the septuple-atomic-layer 2D MoSi2N4\mathrm{MoSi_{2}N_{4}} and WSi2N4\mathrm{WSi_{2}N_{4}} have been synthesizedmsn , which opens up a new 2D material family. The density functional theory (DFT) calculations predict many similar 2D materials with a general formula of MA2Z4\mathrm{MA_{2}Z_{4}}, where M represents an early transition metal (W, V, Nb, Ta, Ti, Zr, Hf, or Cr), A is Si or Ge, and Z stands for N, P, or Asmsn . In quick succession, by intercalating MoS2\mathrm{MoS_{2}}-type MZ2\mathrm{MZ_{2}} monolayer into InSe-type A2Z2\mathrm{A_{2}Z_{2}} monolayer, twelve kinds of 2D family MA2Z4\mathrm{MA_{2}Z_{4}} are proposed with αi\alpha_{i} and βi\beta_{i} (ii=1 to 6) phases with diverse properties from semiconductor to topological insulator to Ising superconductorm20 . Intrinsic piezoelectricity in monolayer MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo, W, Cr, Ti, Zr and Hf) has been predicted by the first-principle calculationsm21 . It is also predicted that the strain can effectively tune the electronic properties of VSi2P4\mathrm{VSi_{2}P_{4}} monolayer, and it undergoes ferromagnetic metal (FMM) to spin-gapless semiconductor (SGS) to ferromagnetic semiconductor (FMS) to SGS to ferromagnetic half-metal (FMHM) with increasing strainm22 . The valley-dependent properties of monolayer MoSi2N4\mathrm{MoSi_{2}N_{4}}, WSi2N4\mathrm{WSi_{2}N_{4}} and MoSi2As4\mathrm{MoSi_{2}As_{4}} have been studied by the DFT calculationsm23 ; m24 .

It’s a natural idea to achieve Janus 2D materials in the new septuple-atomic-layer 2D MA2Z4\mathrm{MA_{2}Z_{4}} family. In this work, inspiring from the already synthesized MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W) by introducing Si during CVD growth of M2N\mathrm{M_{2}N} (M=Mo and W)msn , we construct the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, which may be achieved by introducing Si and Ge during CVD growth of M2N\mathrm{M_{2}N} (M=Mo and W). Their electronic structures, carrier mobilities and piezoelectric properties have been investigated, and show distinct Rashba spin splitting and out-of-plane piezoelectric polarizations compared to MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W) monolayersm21 . It is found that the strain can effectively tune the electronic structures and piezoelectric properties of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers.

The rest of the paper is organized as follows. In the next section, we shall give our computational details and methods. In the next few sections, we shall present structural stabilities, electronic structures, carrier mobilities and piezoelectric properties of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, along with strain effects on their electronic structures and piezoelectric properties. Finally, we shall give our discussion and conclusions.

Table 1: For MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, the lattice constants a0a_{0} (Å\mathrm{{\AA}}), the gaps with GGA and GGA+SOC (eV), and Rashba energy (meV).
Name a0a_{0} Gap Gap-SOC ERE_{R}
MoSiGeN4\mathrm{MoSiGeN_{4}} 2.963 1.116 1.126 0.8
WSiGeN4\mathrm{WSiGeN_{4}} 2.964 1.428 1.408 4.2

II Computational detail

We perform DFT1 calculations for structural relaxation and electronic structures by using the Perdew-Burke-Ernzerhof generalized gradient approximation (PBE-GGA) for the exchange and correlation function, as implemented in the Vienna ab initio simulation package (VASP)pv1 ; pv2 ; pv3 ; pbe . To describe the electron-ion interaction, we use the projector augmented wave (PAW) method. For energy band calculations of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, the SOC is also taken into account. A cutoff energy of 500 eV for the plane wave basis set is used to ensure an accurate DFT calculations. For the convergence of electronic self-consistent calculations, the total energy convergence criterion is set to 10810^{-8} eV, and the Hellmann-Feynman forces on each atom are less than 0.0001 eV.Å1\mathrm{eV.{\AA}^{-1}}. A vacuum spacing of more than 32 Å\mathrm{{\AA}} is adopted to decouple the spurious interaction between the layers.

The coefficients of the elastic stiffness tensor CijC_{ij} and piezoelectric stress coefficients eije_{ij} are calculated by using strain-stress relationship (SSR) and density functional perturbation theory (DFPT) methodpv6 , respectively. The Brillouin zone sampling is done using a Monkhorst-Pack mesh of 16×\times16×\times1 for CijC_{ij}, and 9×\times16×\times1 for eije_{ij}. The 2D elastic coefficients Cij2DC^{2D}_{ij} and piezoelectric stress coefficients eij2De^{2D}_{ij} have been renormalized by the length of unit cell along z direction (LzLz): Cij2DC^{2D}_{ij}=LzLzCij3DC^{3D}_{ij} and eij2De^{2D}_{ij}=LzLzeij3De^{3D}_{ij}. The phonon dispersion spectrums are calculated by Phonopy codepv5 with a supercell of 5×\times5×\times1 using the finite displacement method, and a 3×\times3×\times1 k-mesh is employed. The kinetic energy cutoff is set to 500 eV. The constant energy contour plots of the spin texture are calculated by the PYPROCAR codepy .

Refer to caption
Figure 3: (Color online) The energy band structures of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) using GGA and GGA+SOC.
Refer to caption
Figure 4: (Color online) The enlarged view of the valence bands near the Fermi level for MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers using GGA (Left) and GGA+SOC (Right).

III Structure and stability

The top view and side view of crystal structure of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are shown in Figure 1, and the rhombus primitive cell and the rectangle supercell are shown. The structure of monolayer MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) could be regarded as a MN2\mathrm{MN_{2}} layer sandwiched by Si-N and Ge-N bilayers, which can be constructed by replacing the Si/Ge atoms of top SiN/GeN bilayer in MSi2N4\mathrm{MSi_{2}N_{4}}/ MGe2N4\mathrm{MGe_{2}N_{4}} monolayer with Ge/N atoms. If the Si-N or Ge-N bilayers is considered as a whole, the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers can be viewed as Janus 2D materials. The symmetry of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers (No.156) is lower than that of the MSi2N4\mathrm{MSi_{2}N_{4}}/ MGe2N4\mathrm{MGe_{2}N_{4}} monolayer (No.187) due to the lack of the reflection symmetry with respect to the central M atomic layer. The reduced symmetry can lead to many novel properties, such as Rashba spin splitting and out-of-plane piezoelectric polarizations.

The optimized lattice constants of MoSiGeN4\mathrm{MoSiGeN_{4}}/WSiGeN4\mathrm{WSiGeN_{4}} is aa=bb=2.963/2.964 Å\mathrm{{\AA}} with GGA, being between the ones of MoSi2N4\mathrm{MoSi_{2}N_{4}} (2.91 Å\mathrm{{\AA}})/WSi2N4\mathrm{WSi_{2}N_{4}} (2.91 Å\mathrm{{\AA}}) and MoGe2N4\mathrm{MoGe_{2}N_{4}} (3.02 Å\mathrm{{\AA}})/ WGe2N4\mathrm{WGe_{2}N_{4}}(3.02 Å\mathrm{{\AA}})msn ; m20 . The dynamical stability of the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are tested by analyzing the phonon spectra. Their phonon band dispersions calculated along the high-symmetry directions of the Brillouin zone are shown in Figure 2. The 18 optical and 3 acoustical phonon branches as a total of 21 branches due to 7 atoms per cell are observed. It is clearly seen that the outlines of phonon band dispersions between MoSiGeN4\mathrm{MoSiGeN_{4}} and WSiGeN4\mathrm{WSiGeN_{4}} are very similar. It is noted that the out-of-plane acoustic (ZA) branch corresponding to the out-of-plane vibrations deviates from linearity, which agrees well with the conclusion that the ZA phonon branch should have quadratic dispersion, when the sheet is free of stressr1 ; r2 . All phonon frequencies of the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are positive, which confirms their dynamical stability, and they can exist as free-standing 2D materials.

Refer to caption
Figure 5: (Color online) Spin texture calculated in a kxkyk_{x}-k_{y} plane centered at the Γ\Gamma point and at an energy surface of -0.25 (-0.24) eV below the Fermi level for MoSiGeN4\mathrm{MoSiGeN_{4}}[Top] (WSiGeN4\mathrm{WSiGeN_{4}}[Bottom]) monolayer. The red and blue colours show spin-up and spin-down states, respectively.

It is important to check the mechanical stability of the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers by elastic constants CijC_{ij}. The hexagonal symmetry leads to two independent elastic constants C11C_{11} and C12C_{12} for MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers. The calculated C11C_{11}=C22C_{22}=486.71 Nm1\mathrm{Nm^{-1}}/508.27 Nm1\mathrm{Nm^{-1}} and C12C_{12}=144.14 Nm1\mathrm{Nm^{-1}}/147.21 Nm1\mathrm{Nm^{-1}} for MoSiGeN4\mathrm{MoSiGeN_{4}}/WSiGeN4\mathrm{WSiGeN_{4}} monolayer. For hexagonal symmetry, the mechanical stability of a material should satisfy the Born criteria of mechanical stabilityela :

C11>0,C66>0C_{11}>0,~{}~{}C_{66}>0 (1)

where the C66C_{66}=(C11C_{11}-C12C_{12})/2. The calculated CijC_{ij} confirm the mechanical stability of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers. The Young’s modulus C2D(θ)C_{2D}(\theta) can be calculated on the basis of the elastic constantsela1 :

C2D(θ)=C11C22C122C11sin4θ+Asin2θcos2θ+C22cos4θC_{2D}(\theta)=\frac{C_{11}C_{22}-C_{12}^{2}}{C_{11}sin^{4}\theta+Asin^{2}\theta cos^{2}\theta+C_{22}cos^{4}\theta} (2)

where A=(C11C22C122)/C662C12A=(C_{11}C_{22}-C_{12}^{2})/C_{66}-2C_{12}. It is worth noting that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are mechanically isotropic. The calculated C2DC_{2D} is 444.02 Nm1\mathrm{Nm^{-1}}/465.63 Nm1\mathrm{Nm^{-1}} for MoSiGeN4\mathrm{MoSiGeN_{4}}/WSiGeN4\mathrm{WSiGeN_{4}} monolayer, which are larger than ones of most 2D materialsela2 ; ela3 ; ela4 ; ela5 , indicating that these monolayers are rigid. The Poisson’s ratio ν(θ)\nu(\theta) is also isotropic, and can be attained by:

ν2D=C12C11\nu^{2D}=\frac{C_{12}}{C_{11}} (3)

The calculated ν\nu is 0.296/0.290 for MoSiGeN4\mathrm{MoSiGeN_{4}}/WSiGeN4\mathrm{WSiGeN_{4}} monolayer.

To verify the stability of the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers at room temperature, ab initio molecular dynamics (AIMD) simulations are carried out with a supercell of size 4×\times4×\times1 for more than 3000 fs with a time step of 1 fs. The total energy fluctuations of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers as a function of simulation time together with crystal structures at 300 K after the simulation for 3 ps are shown in FIG.1 of ESI. Calculated results show no obvious structural disruption with the total energy fluctuates being small after 3 ps at 300 K, which proves that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are thermodynamically stable.

The dynamical, thermal and mechanical stability of the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are proved by phonon calculations, AIMD and elastic constants, suggesting the possible synthesis of these monolayers. By introducing Si during CVD growth of M2N\mathrm{M_{2}N} (M=Mo and W), monolayer MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W) have been synthesized in experimentmsn . If the Si and Ge are simultaneously introduced during CVD growth of M2N\mathrm{M_{2}N} (M=Mo and W) to passivate its surface, it is possible to achieve MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers.

Refer to caption
Figure 6: (Color online) The band energies of the VBM and CBM of WSiGeN4\mathrm{WSiGeN_{4}} monolayer with respect to the vacuum energy as a function of lattice dilation along both x and y directions using GGA+SOC. The red solid lines are linear fitting curves with fitted slopes as the DP constant.
Refer to caption
Figure 7: (Color online) The energy band structures of WSiGeN4\mathrm{WSiGeN_{4}} monolayer using GGA+SOC with a/a0a/a_{0} changing from 0.90 to 1.10.

IV Electronic structure

Due to containing transition metal in MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, the SOC is also taken into account. In fact, it has been proved that the SOC has important effects on electronic structures of monolayer MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W), which exhibit rich spin-valley physicsm20 ; m23 ; m24 . Therefore, the SOC is considered for electronic structure calculations of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, and their energy band structures with both GGA and GGA+SOC are plotted in Figure 3. Both GGA and GGA+SOC results show that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are indirect gap semiconductors with the CBM at K point. To accurately determine VBM, the enlarged views of the valence bands near the Fermi level for MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers using GGA and GGA+SOC are plotted in Figure 4. For GGA results, the valence bands of MoSiGeN4\mathrm{MoSiGeN_{4}} around the Γ\Gamma point near the Fermi level are flat with the error less than 1 meV, and the VBM of WSiGeN4\mathrm{WSiGeN_{4}} deviates slightly the Γ\Gamma point. Due to the intrinsic out-of-plane electric field induced by the mirror asymmetry, the Rashba-type spin splitting around the Γ\Gamma point is observed, when the SOC is included. This gives rise to the deviation of VBM of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers with GGA+SOC. It is found that the gap values of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers between GGA and GGA+SOC are very close, and the related data are summarized in Table 1.

From FIG.2 of ESI, the Zeeman-type spin splitting around K/K1 point (the degenerate K and K1 valleys ) in the valence bands near the Fermi level is observed due to SOC together with inversion symmetry breaking. The respective time-reversal symmetry requires that the spin splitting must be opposite at the two distinct valleys, which can be observed from FIG.2 of ESI. Moreover, due to the existence of the horizontal mirror, they are fully spin-polarized in the out-of-plane direction (only SZS_{Z} component), which is confirmed by our calculated results with FIG.2 of ESI being only SZS_{Z} component. MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers have conduction band valleys at K and K1. Although the VBM is not at the K/K1, the valleys are still well defined and not far in energy. The similar results can be observed in monolayer MoSi2N4\mathrm{MoSi_{2}N_{4}}, WSi2N4\mathrm{WSi_{2}N_{4}} and MoSi2As4\mathrm{MoSi_{2}As_{4}}m23 ; m24 .

The constant energy 2D contour plots of spin texture calculated in a kxkyk_{x}-k_{y} plane centered at the Γ\Gamma point are shown in Figure 5. The Rashba-type spin splitting of spin-up (red) and spin-down (blue) electronic bands can be distinctly observed. The 2D Rashba spin splitting of valence bands gives rise to the concentric spin-texture circles with clockwise and counterclockwise rotating spin directions, respectively. The concentric spin-texture circles are due to the pure 2D Rashba spin splitting in the valence bands. It is found that only in-plane SXS_{X} and SYS_{Y} spin components are present in the Rashba spin split bands, without the presence of any out-of-plane SZS_{Z} component, which is also proved from FIG.2 of ESI. The strength of the Rashba effect can be measured by three key parameters: the Rashba energy (ERE_{R}), the Rashba momentum (k0k_{0}), and the Rashba constant (αR\alpha_{R}), and they can be connected by αR\alpha_{R}=2ERE_{R}/k0k_{0}. The ERE_{R} and k0k_{0} are shown in Figure 4. We find that ERE_{R}, k0k_{0} and αR\alpha_{R} of MoSiGeN4\mathrm{MoSiGeN_{4}}/WSiGeN4\mathrm{WSiGeN_{4}} monolayer are 0.8/4.2 meV, 0.048/0.076 Å1\mathrm{{\AA}}^{-1}, and 0.033/0.111 eVÅ\mathrm{{\AA}}.

V Carrier mobility and Piezoelectric properties

The carrier mobilities (μ2D\mu_{2D}) of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are calculated by the deformation potential (DP) theory proposed by Bardeen and Shockleydp , which is defined as:

μ2D=e3C2DKBTmmdEl2\mu_{2D}=\frac{e\hbar^{3}C_{2D}}{K_{B}Tm^{*}m_{d}E_{l}^{2}} (4)

where TT, mm^{*} is temperature and the effective mass in the transport direction, and md=mxmym_{d}=\sqrt{m_{x}m_{y}} is the average effective mass. The elastic modulus C2DC_{2D} can be attained from CijC_{ij}. In addition, ElE_{l} is the DP constant defined by El=ΔE/δE_{l}=\Delta E/\delta , where ΔE\Delta E is the energy shift of the band edge of CBM or VBM with respect to the vacuum level, and δ=Δl/l0\delta=\Delta l/l_{0} with applying uniaxial strain.

Table 2: For MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, elastic modulus (C2DC_{2D}) using GGA, effective mass (mm^{*}) and deformation potential (ElE_{l}) using GGA+SOC, carrier mobility (μ2D\mu_{2D}) at 300 K.
Carrier type C2DC_{2D} (Nm1\mathrm{Nm^{-1}}) mm^{*} ElE_{l} (eV) μ2D\mu_{2D} (cm2V1s1\mathrm{cm^{2}V^{-1}s^{-1}})
Electrons x 444.02 0.41 -3.37 5205.14
MoSiGeN4\mathrm{MoSiGeN_{4}} y 444.02 0.38 -3.13 6573.25
Holes x 444.02 -10.66 3.56 6.56
y 444.02 -10.67 3.39 7.22
Electrons x 465.63 0.30 -4.06 7046.80
WSiGeN4\mathrm{WSiGeN_{4}} y 465.63 0.28 -3.75 8767.94
Holes x 465.63 -8.73 4.17 19.45
y 465.63 -1.29 3.83 155.43
Refer to caption
Figure 8: (Color online) The energy band gaps of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers as a function of a/a0a/a_{0} (0.90-1.10) by using GGA+SOC.

According to DP theory, we calculate the carrier mobilities of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers in both zigzag and armchair directions with armchair and zigzag being defined as x and y directions in Figure 1. The calculated effective masses for electrons and holes of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers with GGA+SOC are shown in Table 2. It is worth noting that the SOC has very important effects on the effective masses for holes due to different energy structures between GGA and GGA+SOC in Figure 4. The band energies of the VBM and CBM with respect to the vacuum energy as a function of Δx/x\Delta x/x and Δy/y\Delta y/y are plotted in Figure 6 for WSiGeN4\mathrm{WSiGeN_{4}} monolayer, and FIG.3 of ESI for MoSiGeN4\mathrm{MoSiGeN_{4}} monolayer. By linearly fitting these energy values, the DP constant ElE_{l} can be attained. The carrier mobilities of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers for the electrons and holes along x and y directions are attained on the basis of the calculated mm^{*}, C2DC_{2D} and ElE_{l}. The related data are summarized in Table 2. The very strong anisotropy of predicted carrier mobilities between electrons and holes is observed, and the electron carrier mobilities of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayer are very higher than those of holes. The electron carrier mobilities of MoSiGeN4\mathrm{MoSiGeN_{4}} (WSiGeN4\mathrm{WSiGeN_{4}}) along x and y directions are up to 5205 cm2V1s1\mathrm{cm^{2}V^{-1}s^{-1}} (7047 cm2V1s1\mathrm{cm^{2}V^{-1}s^{-1}}) and 6573 cm2V1s1\mathrm{cm^{2}V^{-1}s^{-1}} (8768 cm2V1s1\mathrm{cm^{2}V^{-1}s^{-1}}).

Next, we investigate the piezoelectric properties of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers. Performing symmetry analysis, due to a 3m3m point-group symmetry, the piezoelectric stress and strain tensors, and elastic tensor can be reduced intoela2 :

e=(e11e11000e11e31e310)e=\left(\begin{array}[]{ccc}e_{11}&-e_{11}&0\\ 0&0&-e_{11}\\ e_{31}&e_{31}&0\\ \end{array}\right) (5)
d=(d11d110002d11d31d310)d=\left(\begin{array}[]{ccc}d_{11}&-d_{11}&0\\ 0&0&-2d_{11}\\ d_{31}&d_{31}&0\\ \end{array}\right) (6)
C=(C11C120C12C11000(C11C12)/2)C=\left(\begin{array}[]{ccc}C_{11}&C_{12}&0\\ C_{12}&C_{11}&0\\ 0&0&(C_{11}-C_{12})/2\\ \end{array}\right) (7)

Here, the independent d11d_{11} and d31d_{31} are derived by eik=dijCjke_{ik}=d_{ij}C_{jk}:

d11=e11C11C12andd31=e31C11+C12d_{11}=\frac{e_{11}}{C_{11}-C_{12}}~{}~{}~{}and~{}~{}~{}d_{31}=\frac{e_{31}}{C_{11}+C_{12}} (8)
Table 3: Piezoelectric coefficients e11(d11)e_{11}(d_{11}) and e31(d31)e_{31}(d_{31}) of MSiGeN4\mathrm{MSiGeN_{4}}, MSi2N4\mathrm{MSi_{2}N_{4}} and MGe2N4\mathrm{MGe_{2}N_{4}} (M=Mo and W) monolayers, and the unit is 101010^{-10}C/m (pm/V).
Name e11e_{11} d11d_{11} e31e_{31} d31d_{31}
MoSi2N4\mathrm{MoSi_{2}N_{4}} 4.395 1.144 - -
MoSiGeN4\mathrm{MoSiGeN_{4}} 5.116 1.494 -0.087 -0.014
MoGe2N4\mathrm{MoGe_{2}N_{4}} 5.621 1.846 - -
WSi2N4\mathrm{WSi_{2}N_{4}} 3.138 0.778 - -
WSiGeN4\mathrm{WSiGeN_{4}} 3.790 1.050 0.073 0.011
WGe2N4\mathrm{WGe_{2}N_{4}} 4.218 1.306 - -

For eije_{ij}, the orthorhombic supercell of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers (in Figure 1) is adopted, and the calculated eije_{ij} and dijd_{ij} are summarized in Table 3, along with ones of MA2N4\mathrm{MA_{2}N_{4}} (M=Mo and W; A=Si and Ge) monolayer. With respect to the central M atomic plane, the MA2N4\mathrm{MA_{2}N_{4}} (M=Mo and W; A=Si and Ge) monolayer possess a reflection symmetry due to D3hD_{3h} symmetry, which leads to that they have only in-plane piezoelectricity. For MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, the difference in atomic sizes and electronegativities of the second and sixth layer atoms breaks the reflection symmetry along the vertical direction, giving rise to a low degree of 3m3m symmetry. Therefore, both in-plane and vertical piezoelectricity are allowed in MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, when they are subject to a uniaxial in-plane strain. It is clearly seen that both e11e_{11} and d11d_{11} increase with increasing atomic mass from MSi2N4\mathrm{MSi_{2}N_{4}} (M=Mo and W) to MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) to MGe2N4\mathrm{MGe_{2}N_{4}} (M=Mo and W). It is found that the MoSiGeN4\mathrm{MoSiGeN_{4}} and MoA2N4\mathrm{MoA_{2}N_{4}} (A=Si and Ge) monolayers have higher e11e_{11}/d11d_{11} values than WSiGeN4\mathrm{WSiGeN_{4}} and WA2N4\mathrm{WA_{2}N_{4}} (A=Si and Ge) monolayers. For a given metal element M, the monolayers containing heavier column IV element have larger e11e_{11}/d11d_{11} values. More significantly, the MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers possess the vertical piezoelectric effect, which can be described by e31e_{31}/d31d_{31}. However, they are smaller by two orders of magnitude compared to e11e_{11}/d11d_{11}. Similar phenomenon can be observed in Janus MXY (M = Mo or W, X/Y = S, Se, or Te) monolayerela2 .

Refer to caption
Figure 9: (Color online) For monolayer WSiGeN4\mathrm{WSiGeN_{4}}, the elastic constants CijC_{ij} with the application of biaxial strain (0.90 to 1.10).
Refer to caption
Figure 10: (Color online) For monolayer WSiGeN4\mathrm{WSiGeN_{4}}, the piezoelectric stress coefficients e11e_{11} and e31e_{31} along with the ionic contribution and electronic contribution to e11e_{11} and e31e_{31} with the application of biaxial strain (0.90 to 1.10).
Refer to caption
Figure 11: (Color online) For monolayer WSiGeN4\mathrm{WSiGeN_{4}}, the piezoelectric strain coefficients d11d_{11} and d31d_{31} with the application of biaxial strain (0.90 to 1.10).

VI Strain effects

It has been proved that the electronic structures, topological properties, transport and piezoelectric properties of 2D materials can be effectively tuned by strainm12 ; m13 ; m14 ; m15 ; r6 ; r7 ; r8 . Here, we use a/a0a/a_{0} to examine the effects of biaxial strain on the electronic structures of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, where aa and a0a_{0} are the strained and unstrained lattice constant with a/a0a/a_{0}<<1 (a/a0a/a_{0}>>1) being compressive (tensile) strain, The energy band structures of WSiGeN4\mathrm{WSiGeN_{4}} with a/a0a/a_{0} from 0.90 to 1.10 are plotted in Figure 7, and the related energy band structures are shown in FIG.4 of ESI for MoSiGeN4\mathrm{MoSiGeN_{4}}. The energy band gaps of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers as a function of a/a0a/a_{0} are shown in Figure 8. It is found that the energy band gap of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers firstly increases with increasing a/a0a/a_{0}, and then decreases. The up-and down trend of gap can also be observed in many 2D materials, like Janus TMD monolayersq5 and GeSq5-11 . The compressive strain can make conduction band extrema (CBE) of WSiGeN4\mathrm{WSiGeN_{4}} monolayer converge, especially for 0.96 and 0.98 strains. The conduction bands convergence is in favour of n-type Seebeck coefficient. The compressive strain can make K point become VBM, which is very useful for manipulating valley pseudospin. The compressive strain produces another effect that the CBM changes from K point to one point along K-Γ\Gamma line. Similar strain effects on electronic structures of MoSiGeN4\mathrm{MoSiGeN_{4}} can be found. It is noted that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers in considered strain range are all semiconductors, which is useful for their piezoelectric application with strain.

The piezoelectric strain coefficients of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are very small, and strain engineering may be an effective way to enhance their piezoelectric properties. Next, we consider the strain effects on piezoelectric properties of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers. The elastic constants (C11C_{11}, C12C_{12}, C11C_{11}-C12C_{12} and C11C_{11}+C12C_{12}), piezoelectric stress coefficients (e11e_{11} and e31e_{31} along the ionic and electronic contributions), and piezoelectric strain coefficients (d11d_{11} and d31d_{31}) of monolayer WSiGeN4\mathrm{WSiGeN_{4}} as a function of biaxial strain are plotted in Figure 9, Figure 10 and Figure 11, respectively. For MoSiGeN4\mathrm{MoSiGeN_{4}}, these are shown in FIG.5, FIG.6 and FIG.7 of ESI, respectively. With strain from 0.90 to 1.10, the d11d_{11} increases due to decreased C11C_{11}-C12C_{12} and enhanced e11e_{11} based on Equation 8. At 10% strain, the d11d_{11} of WSiGeN4\mathrm{WSiGeN_{4}} (MoSiGeN4\mathrm{MoSiGeN_{4}}) is 7.282 pm/V (8.081 pm/V), which is about seven times (five times) as large as unstrained one of 1.050 pm/V (1.494 pm/V). It is found that both ionic and electronic parts have positive contribution to e11e_{11} with increasing tensile strain. Similar biaxial strain-enhanced d11d_{11} can be observed in monolayer MoSi2N4\mathrm{MoSi_{2}N_{4}}, g-C3N4\mathrm{C_{3}N_{4}} and MoS2\mathrm{MoS_{2}} m21 ; gsd . It is observed that the compressive strain can improve the d31d_{31} (absolute value) of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers due to enhanced e31e_{31} (absolute value), and the d31d_{31} can be improved to 0.082 pm/V (-0.086 pm/V) for WSiGeN4\mathrm{WSiGeN_{4}} (MoSiGeN4\mathrm{MoSiGeN_{4}}) at 0.90 strain. Finally, it is found that theMSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are mechanically stable in the considered strain range, based on calculated elastic constants satisfying the mechanical stability criteria.

VII Discussions and Conclusion

The MSi2N4\mathrm{MSi_{2}N_{4}} (M = Mo, W) monolayers have been recently synthesized, which are grown by passivating the surface dangling bonds of MN2\mathrm{MN_{2}} (M = Mo, W) layer with Si-N tetrahedra when introducing elemental Simsn . Thus, it is possible to achieve Janus MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers by simultaneously introducing Si and Ge elements during CVD growth of nonlayered MN2\mathrm{MN_{2}} (M = Mo, W) to passivate its surface. Compared to MSi2N4\mathrm{MSi_{2}N_{4}} (M = Mo, W) monolayers, the most important difference is that Janus MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers have out-of-plane piezoelectric polarization and Rashba effect due to their out-of-plane asymmetry. Although their out-of-plane piezoelectric polarization and Rashba effect are very weak, our works open a new avenue to achieve Janus materials in the new 2D MA2Z4\mathrm{MA_{2}Z_{4}} family.

In summary, we investigate the electronic structures, carrier mobilities, piezoelectric properties of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers by the reliable first-principle calculations. They are found to exhibit mechanical, thermodynamical and dynamic stability, and high experimental feasibility. It is found that MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers are indirect gap semiconductors. When the SOC is considered, the Rashba effect can be observed in the valence bands of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers. Their electron mobilities are very high due to very light electron effective masses. The e11/d11e_{11}/d_{11} of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers can be induced by a uniaxial strain in the basal plane, similar to MSi2N4\mathrm{MSi_{2}N_{4}} (M = Mo, W) monolayers. In addition to this, a vertical piezoelectric polarization e31/d31e_{31}/d_{31} can be produced upon application of uniaxial or biaxial strains due to the lack of reflection symmetry with respect to M atomic layer. Calculated results show that compressive strain can change the positions of CBM and VBM of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, and tune the strength of conduction bands convergence. It is also found that biaxial strain can enhance d11d_{11} [d31d_{31} (absolute values)] of MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers by tensile [compressive] strain. Our works will stimulate further experimental studies to achieve MSiGeN4\mathrm{MSiGeN_{4}} (M=Mo and W) monolayers, and will motivate farther exploration on Janus monolayers in new 2D MA2Z4\mathrm{MA_{2}Z_{4}} family.

Conflicts of interest
There are no conflicts to declare.

Acknowledgements.
This work is supported by the Natural Science Foundation of Shaanxi Provincial Department of Education (19JK0809). We are grateful to the Advanced Analysis and Computation Center of China University of Mining and Technology (CUMT) for the award of CPU hours and WIEN2k/VASP software to accomplish this work.

References

  • (1) K. S. Novoselov et al., Science 306, 666 (2004).
  • (2) J. P. Ji, X. F. Song, J. Z. Liu et al., Nat. Commun. 7, 13352 (2016).
  • (3) S. Balendhran, S. Walia, H. Nili, S. Sriram and M.Bhaskaran, small 11, 640 (2015).
  • (4) S. L. Zhang M. Q. Xie, F. Y. Li, Z. Yan, Y. F. Li, E. J. Kan, W. Liu, Z. F. Chen, H. B. Zeng, Angew. Chem. 128, 1698 (2016).
  • (5) A. Y. Lu, H. Y. Zhu, J. Xiao et al., Nature Nanotechnology 12, 744 (2017).
  • (6) X. Zhou, Q. Zhang, L. Gan, H. Li and T. Zhai, Adv. Funct. Mater. 26, 4405 (2016).
  • (7) C. Gong, L. Li, Z. Li, H. Ji, A. Stern, Y. Xia, T. Cao, W. Bao, C. Wang, Y. Wang, Z. Q. Qiu, R. J. Cava, S. G. Louie, J. Xia and X. Zhang, Nature 546, 265 (2017).
  • (8) X. M. Wu, Y. L. Feng, S. Li, B. Q. Zhang and G. Y. Gao, J. Phys. Chem. C 124, 16127 (2020).
  • (9) X. Jiang, S. Liu, W. Liang, S. Luo, Z. He, Y. Ge, H. Wang, R. Cao, F. Zhang and Q. Wen, Laser Photonics Rev. 12, 1700229 (2018).
  • (10) C. Xing, S. Chen, X. Liang, Q. Liu, M. Qu, Q. Zou, J. Li, H. Tan, L. Liu and D. Fan, ACS Appl. Mater. Interfaces 10, 27631 (2018).
  • (11) X. Zhou, L. Gan, W. M. Tian et al., Adv. Mater. 27, 8035 (2015).
  • (12) M. Chhowalla, H. S. Shin, G. Eda, L. J. Li, K. P. Loh and H. Zhang, Nature Chemistry 5, 263 (2013).
  • (13) R. X. Fei, W. B. Li, J. Li and L. Yang, Appl. Phys. Lett. 107, 173104 (2015).
  • (14) T. Cao, G. Wang, W. P. Han et al., Nat. Commun. 3, 887 (2012).
  • (15) Y. Deng, Y. Yu, M. Z. Shi, Z. Guo, Z. Xu, J. Wang, X. H. Chen, Y. Zhang, Science 367, 895 (2020).
  • (16) J. Li, Y. Li, S. Du, Z. Wang, B. L. Gu, S. C. Zhang, K. He, W. Duan and Y. Xu, Sci. Adv. 5, eaaw5685 (2019).
  • (17) L. Zhang, Z. J. F. Yang, T. Gong, R. K. Pan, H. D. Wang, Z. N. Guo, H. Zhang and X. Fu, J. Mater. Chem. A 8, 8813 (2020).
  • (18) G. B. R. Singh, Phys. Rev. B 84, 155427 (2011).
  • (19) Y. Guo, S. Zhou, Y. Bai and J. Zhao, Appl. Phys. Lett. 110, 163102 (2017).
  • (20) M. Sun, Q. Ren, S. Wang, J. Yu and W. Tang, J. Phys. D: Appl. Phys. 49, 445305 (2016).
  • (21) Y. C. Cheng, Z. Y. Zhu, M. Tahir and U. Schwingenschlogl, Europhys. Lett. 102, 57001 (2013).
  • (22) Y. D. Guo, H. B. Zhang, H. L. Zeng, H. X. Da, X. H. Yan, W. Y. Liu and X. Y. Mou, Phys. Chem. Chem. Phys. 20, 21113 (2018).
  • (23) R. Peng, Y. Ma, B. Huang and Y. Dai, J. Mater. Chem. A, 7, 603 (2019).
  • (24) A. Mogulkoc, Y. Mogulkoc, S. Jahangirov and E. Durgun, J. Phys. Chem. C 123, 29922 (2019).
  • (25) C. Zhang, Y. Nie, S. Sanvito and A. Du, Nano Lett. 19, 1366 (2019).
  • (26) S. D. Guo, X. S. Guo, R. Y. Han and Y. Deng, Phys. Chem. Chem. Phys. 21, 24620 (2019).
  • (27) J. Zhang, S. Jia, I. Kholmanov et al., ACS Nano 118, 8192 (2017).
  • (28) L. Dong, J. Lou and V. B. Shenoy, ACS Nano 11, 8242 (2017).
  • (29) M. Yagmurcukardes, C. Sevik and F. M. Peeters, Phys. Rev. B 100, 045415 (2019).
  • (30) Y. L. Hong, Z. B. Liu, L. Wang T. Y. Zhou, W. Ma, C. Xu, S. Feng, L. Chen, M. L. Chen, D. M. Sun, X. Q. Chen, H. M. Cheng and W. C. Ren, Science 369, 670 (2020).
  • (31) L. Wang, Y. P. Shi, M. F. Liu et al., arXiv:2008.02981 (2020).
  • (32) S. D. Guo, Y. T. Zhu, W. Q. Mu and W. C. Ren, EPL (2020).
  • (33) S. D. Guo, W. Q. Mu, Y. T. Zhu and X. Q. Chen, Phys. Chem. Chem. Phys. DOI: 10.1039/D0CP05273F (2020).
  • (34) S. Li, W. K. Wu, X. L. Feng et al., arXiv:2009.13253 (2020).
  • (35) C. Yang, Z. G. Song, X. T. Sun and J. Lu, arXiv:2010.10764 (2020).
  • (36) P. Hohenberg and W. Kohn, Phys. Rev. 136, B864 (1964); W. Kohn and L. J. Sham, Phys. Rev. 140, A1133 (1965).
  • (37) G. Kresse, J. Non-Cryst. Solids 193, 222 (1995).
  • (38) G. Kresse and J. Furthmu¨\ddot{u}ller, Comput. Mater. Sci. 6, 15 (1996).
  • (39) G. Kresse and D. Joubert, Phys. Rev. B 59, 1758 (1999).
  • (40) J. P. Perdew, K. Burke and M. Ernzerhof, Phys. Rev. Lett. 77, 3865 (1996). (2006).
  • (41) X. Wu, D. Vanderbilt and D. R. Hamann, Phys. Rev. B 72, 035105 (2005).
  • (42) A. Togo, F. Oba, and I. Tanaka, Phys. Rev. B 78, 134106 (2008).
  • (43) U. Herath, P. Tavadze, X. He, E. Bousquet, S. Singh, F. Munoz and A. H. Romero, Computer Physics Communications 251, 107080 (2020).
  • (44) E. Mariani and F. V. Oppen, Phys. Rev. Lett. 100, 076801 (2008).
  • (45) J. Carrete , W. Li, L. Lindsay, D. A. Broido, L. J. Gallego and N. Mingo, Mater. Res. Lett. 4, 204 (2016).
  • (46) R. C. Andrew, R. E. Mapasha, A. M. Ukpong and N. Chetty, Phys. Rev. B 85, 125428 (2012).
  • (47) E. Cadelano, P. L. Palla, S. Giordano and L. Colombo, Phys. Rev. B 82, 235414 (2010).
  • (48) L. Dong, J. Lou and V. B. Shenoy, ACS Nano, 11, 8242 (2017).
  • (49) M. N. Blonsky, H. L. Zhuang, A. K. Singh and R. G. Hennig, ACS Nano, 9, 9885 (2015).
  • (50) R. X. Fei, We. B. Li, J. Li and L. Yang, Appl. Phys. Lett. 107, 173104 (2015).
  • (51) K. N. Duerloo, M. T. Ong and E. J. Reed, J. Phys. Chem. Lett. 3, 2871 (2012).
  • (52) S. Bruzzone and G. Fiori, Appl. Phys. Lett. 99, 222108 (2011).
  • (53) E. Scalise, M. Houssa, G. Pourtois, V. Afanas’ev and A. Stesmans, Nano Res. 5, 43 (2012).
  • (54) H. K. Liu, G. Z. Qin, Y. Lin and M. Hu, Nano Lett. 16, 3831 (2016).
  • (55) N. Jena, Dimple, S. D. Behere and A. D. Sarkar, J. Phys. Chem. C 121, 9181 (2017).
  • (56) Dimple, N. Jena, A. Rawat, R. Ahammed, M. K. Mohanta and A. D. Sarkar, J. Mater. Chem. A 6, 24885 (2018).
  • (57) Z. Q. Fan, X. W. Jiang, Z. M. Wei, J. W. Luo and S. S. Li, J. Phys. Chem. C 121, 14373 (2017).
  • (58) S. D. Guo, X. S. Guo, Y. Y. Zhang and K. Luo, J. Alloy. Compd. 822, 153577 (2020).
  • (59) X. X. Xue, Y. X. Feng, L. Liao, Q. J. Chen, D. Wang, L. M. Tang and K. Chen, J. Phys.: Condens. Matter 30, 125001 (2018).
  • (60) S. D. Guo and J. Dong, Semicond. Sci. Tech. 33, 085003 (2018).
  • (61) S. L. Zhang, N. Wang, S. G. Liu et al., Nanotechnology 27, 274001 (2016).
  • (62) S. D. Guo, W. Q. Mu and Y. T. Zhu, arXiv:2008.05618 (2020).